|
|
 |
Our Eddy Current probes and eddy current PC Windows are designed and manufactured with
unique advance technology. We invite youto join us in the new era of advanced technology in Eddy-Current Instrumentation and semiconductor equipmentOur Eddy-Current Inspection System integrates
eddy-current nondestructive testing technology with a full spectrum of inspection solutions ranging from state-of-the-art Hardware/Software products to Automated Inspection for tube inspection and
semiconductor equipment The Andrew NDT Engineering Staff is composed of metallurgical, electronic, NDT, mechanical and software engineers, machinists, probe designers, and assemblers |
|
|
Our ET Inspection System Specialists are dedicated to providing our customer with: |
- A cost effective eddy-current Inspection System Development Plan
- PC-based software/hardware integration of the Eddy-Current Inspection System
- Eddy current engineering solution ranging from probe design to automated inspection system
- Eddy current component design solutions for probes, fixtures, standards, equipment, hardware/software and motion control
- Full service product technical support
|
Andrew NDT Engineering's Advanced ET Technological Solutions: |
- Stand-Alone system for 200 mm and 300 mm wafer thickness measurement.
- Table-Top system for 200 mm and 300 mm wafer thickness measurement
- Integration-Module for 200 mm and 300 mm wafer thickness measurement.
- State-of-the-art integration of the Eddy-Current Inspection System featuring a 28 feet-per-second hyper-speed inspection capability for tube inspection
- Remote ET Field solution for the "blind zone" support-sheet problem
- PC Board producing a 20 Volt peak-to-peak and 50 milli-ampere output achieving a remote field ET probe penetration up to 0.300 inch while maintaining a through-tube-hole detection capacity of
0.062 inch
- PC-based Probe Characterization System
determines the optimum operating frequency and range of the individual probe, thus yielding highly refined control of the basic electronic characteristics of reactance, resistance and inductance
|
|
|